Group-delay measurement on laser mirrors by spectrally resolved white-light interferometry.
نویسندگان
چکیده
The frequency-dependent group delay of dielectric mirrors was measured by spectrally resolved white-light interferometry. Chirped mirrors and thin-film Gires-Tournois interferometers designed for dispersion control in a femtosecond Ti:sapphire laser oscillator-amplifier system were tested with a group-delay resolution of +/-0.2 fs and a spectral resolution of ~1 nm over the spectral range of 670-870 nm.
منابع مشابه
Mode-resolved frequency comb interferometry for high-accuracy long distance measurement
Optical frequency combs have developed into powerful tools for distance metrology. In this paper we demonstrate absolute long distance measurement using a single femtosecond frequency comb laser as a multi-wavelength source. By applying a high-resolution spectrometer based on a virtually imaged phased array, the frequency comb modes are resolved spectrally to the level of an individual mode. Ha...
متن کاملMeasurement of the group-delay dispersion of femtosecond optics using white-light interferometry
A compact and practical white-light cross-correlator suitable for fast evaluation of femtosecond optics, in terms of group-delay dispersion, was developed. A 40-W tungsten-halogen lamp was used as a white-light source and the detector selection was made so as to have adequate spectral sensitivity from 600 to 1050 nm, peaked at 800 nm. Group-delay dispersion was obtained, with femtosecond time r...
متن کاملDispersion measurements with white-light interferometry
White-light interferograms provide a simple, accurate, and physically intuitive picture of what happens to broadband optical pulses on transmission through, or reflection from, common optical materials. Quantitative measurement of group delay are made with an accuracy of 60.1 fs and with high spectral resolution. This measurement accuracy is applied to the determination of d2nydl2 and d3nydl3 o...
متن کاملThin-film thickness profile and its refractive index measurements by dispersive white-light interferometry.
As an extension of the authors' previous report of Ref 1, we describe an improved version of dispersive white-light interferometry that enables us to measure the tomographical thickness profile of a thin-film layer through Fourier-transform analysis of spectrally-resolved interference signals. The group refractive index can also be determined without prior knowledge of the geometrical thickness...
متن کاملPhase retrieval and compression of low-power white-light pulses
We characterize and compress sub-nJ visible white-light continuum (WLC) pulses generated by self-phase modulation in yttrium aluminium garnet. The spectral phase is retrieved by spectrally resolving the transient reflectivity from an optically-excited transition metal oxide. This measured phase is compensated by applying the appropriate distortion to a deformable mirror. By comparing the respon...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید
ثبت ناماگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید
ورودعنوان ژورنال:
- Optics letters
دوره 20 7 شماره
صفحات -
تاریخ انتشار 1995